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      Scanning Electron Microscopy and X-Ray Microanalysis

      Scanning Electron Microscopy and X-Ray Microanalysis

      Nicholas W. M. Ritchie, Dale Newbury, David C. Joy, Joseph Michael, Joseph Goldstein, John Henry Scott
      0.0 / 10 ( 0 votes)
      Categories:
      Books in Foreign Languages, General History
      Language:
      Engleza
      Publishing Date:
      2017
      Publisher:
      Page Count:
      550
      Edition:
      4th ed. 2018
      ISBN:
      9781493966745
      Dimensions: l: 28.4cm | H: 21.7cm | 3.6cm | 1760g
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