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      VLSI Design and Test for Systems Dependability

      VLSI Design and Test for Systems Dependability

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      Categories:
      General History
      Publishing Date:
      2018
      Publisher:
      Cover Type:
      Hardcover
      Page Count:
      800
      Edition:
      1st ed. 2019
      ISBN:
      9784431565925
      Dimensions: l: 16.4cm | H: 24.2cm | 5cm | 1428g
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      Publisher's Synopsis
      This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts.
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