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      Conductive Atomic Force Microscopy

      Conductive Atomic Force Microscopy

      Applications in Nanomaterials
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      Categories:
      History of science and overview
      Language:
      Engleza
      Publishing Date:
      2017
      Publisher:
      Cover Type:
      Hardcover
      Page Count:
      384
      ISBN:
      9783527340910
      Dimensions: l: 25.1cm | H: 17.6cm | 2.5cm | 978g
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      Publisher's Synopsis
      The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
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